Index: /branches/pap_branch_080320/ippconfig/recipes/ppMerge.config
===================================================================
--- /branches/pap_branch_080320/ippconfig/recipes/ppMerge.config	(revision 17085)
+++ /branches/pap_branch_080320/ippconfig/recipes/ppMerge.config	(revision 17086)
@@ -3,5 +3,5 @@
 ROWS            S32     128		# Number of rows to read at once
 ELECTRONS       F32     100.0           # Minimum number of electrons for useful signal
-SAMPLE          S32     100             # Sampling factor for measuring the background
+SAMPLE          S32     100000          # Sampling factor for measuring the background
 REJ		F32	3.0		# Rejection threshold (sigma)
 ITER		S32	0		# Number of rejection iterations
@@ -18,12 +18,16 @@
 SHUTTER.REJECT	F32	2		# Rejection limit for shutter measurement
 MASK.SUSPECT	F32	5.0		# Threshold for suspect pixels (sigma)
-MASK.BAD	F32	4.0		# Threshold for bad pixels (sigma)
-MASK.MODE	STR	POISSON		# Threshold for bad pixels (sigma)
-STATS.BY.CHIP   BOOL	TRUE		# measure stats for masking by chip (or by readout)
-MASK.GROW.NPIX  S32	3		# measure stats for masking by chip (or by readout)
+MASK.BAD	F32	0.2		# Threshold for bad pixels
+MASK.MODE	STR	FRACTION	# Mode for identifying bad pixels in the suspect map
+MASK.CHIPSTATS	BOOL	TRUE		# Measure stats for masking by chip (otherwise by readout)?
+MASK.GROW	S32	0		# Grow bad pixels by this radius
+MASK.GROWVAL	STR	SUSPECT		# Give grown mask pixels this value
 MASKVAL		STR	SAT,BAD		# Mask value for input data
 COMBINE		STR	CLIPPED		# Statistic to use for combination
 MEAN		STR	ROBUST_MEDIAN	# Statistic to use to measure the mean
 STDEV		STR	ROBUST_STDEV	# Statistic to use to measure the stdev
+
+STATS.BY.CHIP   BOOL    TRUE            # measure stats for masking by chip (or by readout)
+MASK.GROW.NPIX  S32     3               # measure stats for masking by chip (or by readout)
 
 # Ordinates for fitting dark current
@@ -47,6 +51,6 @@
 # More aggressive clipping than bias, so as to remove CRs
 PPMERGE_DARK	METADATA
-	REJ		F32	2.0		# Rejection threshold (sigma)
-	ITER		S32	4		# Number of rejection iterations
+	REJ		F32	3.0		# Rejection threshold (sigma)
+	ITER		S32	2		# Number of rejection iterations
 	FRACHIGH	F32	0.0		# Fraction of high pixels to reject immediately
 	FRACLOW		F32	0.0		# Fraction of low pixels to reject immediately
@@ -75,12 +79,14 @@
 # Mask generation --- already included in default, above
 PPMERGE_DARKMASK METADATA
-  MASK.BAD	 F32	3.0		# Threshold for bad pixels (sigma)
-  MASK.MODE	 STR	VALUE		# Threshold for bad pixels (sigma)
+	ITER		S32	2		# Number of iterations
+	MASK.BAD	F32	3.0		# Threshold for bad pixels (sigma)
+	MASK.MODE	STR	VALUE		# Mode for identifying bad pixels in the suspect map
 END
 
 # Mask generation --- already included in default, above
 PPMERGE_FLATMASK METADATA
-  MASK.BAD	 F32	3.0		# Threshold for bad pixels (sigma)
-  MASK.MODE	 STR	VALUE		# Threshold for bad pixels (sigma)
+	ITER		S32	2		# Number of iterations
+	MASK.BAD	F32	3.0		# Threshold for bad pixels (sigma)
+	MASK.MODE	STR	VALUE		# Mode for identifying bad pixels in the suspect map
 END