Index: /trunk/doc/release.2015/ps1.detrend/detrend.tex
===================================================================
--- /trunk/doc/release.2015/ps1.detrend/detrend.tex	(revision 41219)
+++ /trunk/doc/release.2015/ps1.detrend/detrend.tex	(revision 41220)
@@ -26,6 +26,6 @@
 
 % use this to make the figure picture path flexible:
-%\def\picdir{images}
-\def\picdir{.}
+\def\picdir{images}
+% \def\picdir{.}
 
 % CZW commands from my previous draft.
@@ -307,31 +307,29 @@
 
 \begin{table*}
-\caption{\label{tab:detrend.steps} Detrend steps in IPP} % \vspace{-0.5cm}
+\caption{\label{tab:detrend.steps} Detrend steps in order of application} % \vspace{-0.5cm}
 \begin{center}
 \footnotesize
-\begin{tabular}{lr}
+\begin{tabular}{lll}
 \hline
 \hline
-{\bf Measurement} & {\bf Notes} \\
+{\bf Detrend} & {\bf Stage} & {\bf Section} \\
 \hline
-  burntool repair & registration stage \\
-  non-linearity correction & \\
-  Overscan Subtraction     & \\
-  Dark \& Bias Subtraction & \\
-  Pattern Row correction & \\
-  Noisemap                 & \\
-  Flat-field Correction    & \\
-  Fringe Correction        & only \yps \\
-  Pattern Contiuity & \\
-  Static Masks             & \\
-  Dynamic Masks            & camera stage \\
-  crosstalk & \\
-  optical ghosts & \\
-  optical glints & \\
-  diffraction spikes & \\
-  saturated stars & \\
-  
+  Burntool repair          & registration & \ref{sec:burntool} \\
+  Non-linearity correction & cell         & \ref{sec:nonlinearity} \\
+  Overscan Subtraction     & cell         & \ref{sec:overscan} \\
+  Dark \& Bias Subtraction & cell         & \ref{sec:dark} \\
+  Pattern Row correction   & cell         & \ref{sec:pattern.row} \\
+  Noisemap                 & cell         & \ref{sec:noisemap} \\
+  Flat-field Correction    & chip         & \ref{sec:flat} \\
+  Fringe Correction$^1$    & chip         & \ref{sec:fringe} \\
+  Pattern Continuity       & chip         & \ref{sec:pattern_continuity} \\
+  Static Masks             & chip         & \ref{sec:static_masks} \\
+  Crosstalk masks          & camera       & \ref{sec:crosstalk} \\
+  Optical ghost masks      & camera       & \ref{sec:optical_ghosts} \\
+  Optical glint masks      & camera       & \ref{sec:glints} \\
+  Diffraction spike masks  & camera       & \ref{sec:diffraction_spikes} \\
+  Saturated star masks     & camera       & \ref{sec:diffraction_spikes} \\
 \hline
-\multicolumn{5}{l}{$^2$ PSF modeling is perform by {\tt ppSub} on the input warps before calling {\tt psphot}} \\
+\multicolumn{3}{l}{$^1$ only \yps} \\
 \end{tabular}
 \end{center}
@@ -680,4 +678,5 @@
 
 \subsection{Flat}
+\label{sec:flat}
 
 Determining a flat field correction for GPC1 is a challenging
@@ -1578,4 +1577,5 @@
 
 \subsubsection{Pattern Continuity}
+\label{sec:pattern_continuity}
 
 \begin{figure*}[htpb]
@@ -1859,4 +1859,22 @@
 \label{sec:warping}
 
+\begin{figure*}[htpb]
+  \centering
+  \includegraphics[width=0.9\hsize,angle=0,clip]{\picdir/{warp.and.stack.demo}.pdf}
+  \caption{Warping and Stacking Flowchart.  The diagram on the
+    upper right shows an example of two neighboring GPC1 exposures
+    (red and blue lines) overlaid on the grid of skycells for the
+    {\tt RINGS.V3} tessellation (grey lines).  The upper-left portion
+    shows a zoom in on a region to illustrate the overlaps.  Below is
+    a flowchart of the processing steps: exposures are processed
+    through detrending ({\tt chip}) and calibration ({\tt
+        camera}). The {\tt warp} stage combines the chip pixels overlapping
+      specific skycells to generate the warps for those skycells.  The
+      pixels for warps from the same skycells are combined together in
+      the {\tt stack} stage.
+}
+\label{fig:warp.and.stack.flowchart}
+\end{figure*}
+
 In order to perform image combination operations (stacking and
 differences), the individual OTA images are geometrically transformed