= Summary of MDdeeptest_pixrej_20140403 = [[PageOutline]] (back to [wiki:MediumDeepFields] summary) For a while it has been bothersome to find junk in the MD stacks through just simple visual inspection as would not be expected in N=60 (refstack) and definitely not for N>>60 (deepstack), and they can also come and go depending on the inputs used. This seems to be at least configs needing tuning, at worst code bugs. A related issue also to be addressed is the ratty edge of the MD stacks due to poorer edge chips and smaller number of input pixels. Possible alternatives for a solution are * hard cut by radius field by field and filter -- * combine MD+3PI to help improve by including better 3PI pixels -- * only include pixel if N input > some minimum, similar to the SAFE (N=2) option but with a larger N minimum -- * any others options? ---- = Example Junk and Bugs = Large regions of high level, bad pixels (spike chunks, the moth) -- bugs || img || mk || wt || num || exp || expwt || [[Image(.png,300px)]] * due to NAN/0 bug from unprotected denominator being 0, setting mean and sigma to NAN (all inputs used) Excess hot pixels/CR-like -- || img || mk || wt || num || exp || expwt || [[Image(.png,300px)]] * due to bug shown after NAN/0 bug fixed, sigma sometimes being set to a negative value resulting in final mean and sigma going NAN (all inputs used) Large region of low level, bad pixels -- bug? much can be reduced by config mods || img || mk || wt || num || exp || expwt || [[Image(.png,300px)]] * greatly reduced by lowering THRESHOLD.MASK 0.5->0.01 (may need further modifications) Edge ''pomegranate-like webbing'' -- bug? much can be reduced by config mods || img || mk || wt || num || exp || expwt || [[Image(.png,300px)]] * greatly reduced by lowering THRESHOLD.MASK 0.5->0.01 (may need further modifications) Misc edge junk -- ---- = Test Samples = All should be available via the PSS, if large or full sets are desired then can be push to the datastore (let us know) MD04 PV2 warps -- MD04.cut2009deeptest.20131103 for manual testing, the full test runs below used all available PV2 through the end of the survey ([wiki:MD.PV2]) * label: MD04.pv2_stacktest.20130903 3PI exposures overlapping with MD04 -- span Apr. 2009 to Feb. 17 2014, however any exposures before June 2010 will be excluded just like the MD04 exposures (i.e., cut2009 condition described at [wiki:MD04.pv2_stacktest.20130903#DeepStacks]) * label: MD04.test3pistack.20140217 -- * (need to add total and used numbers) MD04+3PI overlap test with just the bug fixes to compare the edge quality -- will include additional PV2 warps through end of survey for MD04, but just 3PI though Feb. 2014 * label: MD04_3PI.cut2009teststack.20140404 -- g-band only MD04+3PI overlap test with bug fixes and config mods to compare the edge quality -- will include same available warps * label: MD04_3PI.cut2009teststack.20140411 -- again g-band only * THRESHOLD.MASK 0.01 * COMBINE.REJ 2.5 MD04 with bug fixes, config mods, N>20 inputs per pixel to clean up the field edge -- can compare to MD04.cut2009deeptest.20131103 since inputs limited by date here * label: MD04.cut2009n20deeptest.20140413 -- i-band only * THRESHOLD.MASK 0.01 * COMBINE.REJ 2.5 ---- = Configuration Mods = This should be done properly before the final version, but will take some time to do