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Changeset 40303 for trunk


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Timestamp:
Dec 21, 2017, 7:30:29 AM (9 years ago)
Author:
eugene
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working on changes from referee

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1 edited

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  • trunk/doc/release.2015/systematics.20140411/diffusion.tex

    r40300 r40303  
    308308grid of images of a dense stellar field.  The purpose of this second
    309309step is to correct the basic flat-field image for errors arising from
    310 the non-uniformity of the illumination, from non-pixel uniformity due
    311 to the varying optical distorition across the field, and any other
    312 factors which may make the flat-field image inconsistent with stellar
    313 photometry, e.g., SED, filter band-pass variations, etc
     310the non-uniformity of the illumination, from \newtext{variations in
     311  the effective pixel size} \oldtext{non-pixel uniformity} due to the
     312varying optical \newtext{distortion} \oldtext{distorition} across the
     313field, and any other factors which may make the flat-field image
     314inconsistent with stellar photometry, e.g., SED, filter band-pass
     315variations, etc
    314316\citep[see][]{waters2017,2004PASP..116..449M,2007ASPC..364..153M}.
    315 This correction was made on a relatively coarse grid across the focal
    316 plane in order to accumulate sufficient statistics from the stars in
    317 the relatively small number of images available at the time.  We have
    318 found that a single flat-field set can be used for all PS1
    319 observations to yield photometric systematic errors at the level of \approx
    320 2\%.  PS1 benefits in this regard from the stability of having a
    321 single instrument which is rarely removed.
     317This correction was made on a relatively coarse \newtext{(\approx 1200
     318  CCD pixels per sample)} grid across the focal plane in order to
     319accumulate sufficient statistics from the stars in the relatively
     320small number of images available at the time.  We have found that a
     321single flat-field set can be used for all PS1 observations to yield
     322photometric systematic errors at the level of \approx 2\%.  PS1
     323benefits in this regard from the stability of having a single
     324instrument which is rarely removed.
    322325
    323326Photometry of the PS1 images is performed using a
     
    346349photometry, resulting in photometric systematic uncertainties in the
    347350range 7 - 12 millimagnitudes, depending on the filter
    348 \citep{2013ApJS..205...20M}.
     351\citep{2013ApJS..205...20M}.  \newtext{We note that the PV3 analysis
     352  used for the public release includes a flat-field correction
     353  measured with a much finer spatial sampling than the PV2 analysis,
     354  with 40 CCD pixels per superpixel.  As a result, some of the
     355  fine-grained structure discussed below is corrected in the public
     356  release (see however the caveats in the discussion section below).}
    349357
    350358For all objects, positions are measured from the PSF model for the
     
    393401the boule from which they came.  This gives the impression that a
    394402similar mechanism is responsible for the pattern observed in the PS1
    395 photometry and the DECam photometry, namely the diffusive effects of
    396 lateral electric field variations in the detectors.  In the next
    397 section, we will make the case that the patterns observed in the PS1
    398 photometry residuals are {\em not} caused by this mechanism, but are
    399 instead caused by variations in the {\em vertical} electric field (the
    400 field direction perpendicular to the CCD surface).
     403photometry and the DECam photometry, namely the \oldtext{diffusive
     404  effects of} \newtext{migration of charge by} lateral electric
     405\newtext{fields} \oldtext{field variations} in the detectors.  In the
     406next section, we will make the case that the patterns observed in the
     407PS1 photometry residuals are {\em not} caused by this mechanism, but
     408are instead caused by variations in the {\em vertical} electric field
     409(the field direction perpendicular to the CCD surface).
    401410
    402411First, in this section, we will describe how we have measured the
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