IPP Software Navigation Tools IPP Links Communication Pan-STARRS Links

Ignore:
Timestamp:
Mar 28, 2008, 5:21:54 PM (18 years ago)
Author:
Paul Price
Message:

Merging in pap_branch_080328 --- modernised ppMerge.

File:
1 edited

Legend:

Unmodified
Added
Removed
  • trunk/ippconfig/recipes/ppMerge.config

    r16953 r17231  
    11# Recipe configuration for ppMerge
    2  
     2
    33ROWS            S32     128             # Number of rows to read at once
    44ELECTRONS       F32     100.0           # Minimum number of electrons for useful signal
    5 SAMPLE          S32     100             # Sampling factor for measuring the background
     5SAMPLE          S32     100000          # Sampling factor for measuring the background
    66REJ             F32     3.0             # Rejection threshold (sigma)
    77ITER            S32     0               # Number of rejection iterations
     
    1515FRINGE.YSMOOTH  S32     11              # Number of smoothing regions in y
    1616SHUTTER.SIZE    S32     128             # Size for shutter measurement regions
    17 SHUTTER.ITER    S32     1               # Number of iterations for shutter measurement
    18 SHUTTER.REJECT  F32     2               # Rejection limit for shutter measurement
    1917MASK.SUSPECT    F32     5.0             # Threshold for suspect pixels (sigma)
    20 MASK.BAD        F32     4.0             # Threshold for bad pixels (sigma)
    21 MASK.MODE       STR     POISSON         # Threshold for bad pixels (sigma)
    22 STATS.BY.CHIP   BOOL    TRUE            # measure stats for masking by chip (or by readout)
    23 MASK.GROW.NPIX  S32     3               # measure stats for masking by chip (or by readout)
     18MASK.BAD        F32     0.2             # Threshold for bad pixels
     19MASK.MODE       STR     FRACTION        # Mode for identifying bad pixels in the suspect map
     20MASK.CHIPSTATS  BOOL    TRUE            # Measure stats for masking by chip (otherwise by readout)?
     21MASK.GROW       S32     0               # Grow bad pixels by this radius
     22MASK.GROWVAL    STR     SUSPECT         # Give grown mask pixels this value
    2423MASKVAL         STR     SAT,BAD         # Mask value for input data
    2524COMBINE         STR     CLIPPED         # Statistic to use for combination
    2625MEAN            STR     ROBUST_MEDIAN   # Statistic to use to measure the mean
    2726STDEV           STR     ROBUST_STDEV    # Statistic to use to measure the stdev
     27
     28STATS.BY.CHIP   BOOL    TRUE            # measure stats for masking by chip (or by readout)
     29MASK.GROW.NPIX  S32     3               # measure stats for masking by chip (or by readout)
    2830
    2931# Ordinates for fitting dark current
     
    4749# More aggressive clipping than bias, so as to remove CRs
    4850PPMERGE_DARK    METADATA
    49         REJ             F32     2.0             # Rejection threshold (sigma)
    50         ITER            S32     4               # Number of rejection iterations
     51        REJ             F32     3.0             # Rejection threshold (sigma)
     52        ITER            S32     2               # Number of rejection iterations
    5153        FRACHIGH        F32     0.0             # Fraction of high pixels to reject immediately
    5254        FRACLOW         F32     0.0             # Fraction of low pixels to reject immediately
    53         WEIGHTS         BOOL    FALSE           # Use image weights?
     55        WEIGHTS         BOOL    TRUE            # Use image weights?
    5456        COMBINE         STR     CLIPPED         # Statistic to use for combination:
    5557END
     
    7577# Mask generation --- already included in default, above
    7678PPMERGE_DARKMASK METADATA
    77   MASK.BAD       F32    3.0             # Threshold for bad pixels (sigma)
    78   MASK.MODE      STR    VALUE           # Threshold for bad pixels (sigma)
     79        ITER            S32     2               # Number of iterations
     80        MASK.BAD        F32     0.2             # Threshold for bad pixels (sigma)
     81        MASK.MODE       STR     FRACTION        # Mode for identifying bad pixels in the suspect map
    7982END
    8083
    8184# Mask generation --- already included in default, above
    8285PPMERGE_FLATMASK METADATA
    83   MASK.BAD       F32    3.0             # Threshold for bad pixels (sigma)
    84   MASK.MODE      STR    VALUE           # Threshold for bad pixels (sigma)
     86        ITER            S32     2               # Number of iterations
     87        MASK.BAD        F32     0.2             # Threshold for bad pixels (sigma)
     88        MASK.MODE       STR     FRACTION        # Mode for identifying bad pixels in the suspect map
    8589END
    8690
    8791# Shutter generation --- already included in default, above
    8892PPMERGE_SHUTTER METADATA
     93        REJ             F32     2.0             # Rejection threshold (sigma)
     94        ITER            S32     1               # Number of rejection iterations
    8995END
Note: See TracChangeset for help on using the changeset viewer.