Changeset 25027 for branches/pap/ippconfig/recipes/ppMerge.config
- Timestamp:
- Aug 7, 2009, 4:08:25 PM (17 years ago)
- Location:
- branches/pap
- Files:
-
- 2 edited
-
. (modified) (1 prop)
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ippconfig/recipes/ppMerge.config (modified) (3 diffs)
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branches/pap
- Property svn:mergeinfo changed
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branches/pap/ippconfig/recipes/ppMerge.config
r23471 r25027 1 1 # Recipe configuration for ppMerge 2 2 3 ROWS S32 128 # Number of rows to read at once 4 ELECTRONS F32 100.0 # Minimum number of electrons for useful signal 5 SAMPLE S32 100000 # Sampling factor for measuring the background 6 REJ F32 3.0 # Rejection threshold (sigma) 7 ITER S32 2 # Number of rejection iterations 8 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 9 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 10 NKEEP S32 5 # Minimum number of pixels in stack to keep 11 VARIANCES BOOL FALSE # Use image variances in combination? 12 FRINGE.NUM S32 10000 # Number of fringe regions 13 FRINGE.SIZE S32 5 # Half-size of fringe regions 14 FRINGE.XSMOOTH S32 5 # Number of smoothing regions in x 15 FRINGE.YSMOOTH S32 11 # Number of smoothing regions in y 16 CTE.MIN F32 0.2 # regions lower than this in the CTE image are masked 17 SHUTTER.SIZE S32 128 # Size for shutter measurement regions 18 MASK.SUSPECT F32 5.0 # Threshold for suspect pixels (sigma) 19 MASK.BAD F32 0.2 # Threshold for bad pixels 20 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 21 MASK.CHIPSTATS BOOL TRUE # Measure stats for masking by chip (otherwise by readout)? 22 MASK.GROW S32 0 # Grow bad pixels by this radius 23 MASK.SET.VALUE STR FLAT # set this bit in the output mask 3 ROWS S32 128 # Number of rows to read at once 4 ELECTRONS F32 100.0 # Minimum number of electrons for useful signal 5 SAMPLE S32 100000 # Sampling factor for measuring the background 6 REJ F32 3.0 # Rejection threshold (sigma) 7 ITER S32 2 # Number of rejection iterations 8 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 9 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 10 NKEEP S32 5 # Minimum number of pixels in stack to keep 11 VARIANCES BOOL FALSE # Use image variances in combination? 24 12 25 COMBINE STR CLIPPED # Statistic to use for combination 26 MEAN STR ROBUST_MEDIAN # Statistic to use to measure the mean 27 STDEV STR ROBUST_STDEV # Statistic to use to measure the stdev 13 FRINGE.NUM S32 10000 # Number of fringe regions 14 FRINGE.SIZE S32 5 # Half-size of fringe regions 15 FRINGE.XSMOOTH S32 5 # Number of smoothing regions in x 16 FRINGE.YSMOOTH S32 11 # Number of smoothing regions in y 17 FRINGE.SMOOTH BOOL FALSE # Smooth the output image? 18 FRINGE.SMOOTH.SIGMA F32 2.0 # Sigma of smoothing Gaussian 28 19 29 MASK.SMOOTH.SUSPECT BOOL TRUE # smooth the suspect-pixel image before making mask 30 MASK.SMOOTH.SCALE F32 3.0 # sigma (pixels) of smoothing kernel 20 CTE.MIN F32 0.5 # regions lower than this in the CTE image are masked 21 SHUTTER.SIZE S32 128 # Size for shutter measurement regions 31 22 32 STATS.BY.CHIP BOOL TRUE # measure stats for masking by chip (or by readout) 33 MASK.GROW.NPIX S32 3 # measure stats for masking by chip (or by readout) 23 INPUT.MASKS.USE BOOL TRUE # respect the input mask data? 24 25 COMBINE STR CLIPPED # Statistic to use for combination 26 MEAN STR ROBUST_MEDIAN # Statistic to use to measure the mean 27 STDEV STR ROBUST_STDEV # Statistic to use to measure the stdev 28 29 MASK.SUSPECT.MODE STR SIGMA # how to identify suspect pixels: SIGMA, VALUE 30 MASK.SUSPECT.MIN F32 -100.0 # for MASK.SUSPECT.MODE == VALUE, below this is suspect 31 MASK.SUSPECT.MAX F32 +100.0 # for MASK.SUSPECT.MODE == VALUE, above this is suspect 32 MASK.SUSPECT.SIGMA F32 5.0 # Threshold for suspect pixels (sigma) 33 34 MASK.SMOOTH.SUSPECT BOOL TRUE # smooth the suspect-pixel image before making mask 35 MASK.SMOOTH.SCALE F32 3.0 # sigma (pixels) of smoothing kernel 36 37 MASK.BAD F32 0.2 # Threshold for bad pixels 38 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 39 MASK.CHIPSTATS BOOL TRUE # Measure stats for masking by chip (otherwise by readout)? 40 MASK.GROW S32 0 # Grow bad pixels by this radius 41 MASK.SET.VALUE STR FLAT # set this bit in the output mask 42 43 STATS.BY.CHIP BOOL TRUE # measure stats for masking by chip (or by readout) 44 MASK.GROW.NPIX S32 3 # measure stats for masking by chip (or by readout) 34 45 35 46 # Ordinates for fitting dark current 36 DARK.ORDINATES 37 CELL.DARKTIME S32 1# Traditional dark current term47 DARK.ORDINATES METADATA 48 CELL.DARKTIME S32 1 # Traditional dark current term 38 49 END 39 DARK.NORM STR NONE# Dark normalisation concept50 DARK.NORM STR NONE # Dark normalisation concept 40 51 41 52 # Bias combination --- don't want min/max rejection 42 PPMERGE_BIAS 43 REJ F32 3.0# Rejection threshold (sigma)44 ITER S32 2# Number of rejection iterations45 FRACHIGH F32 0.0# Fraction of high pixels to reject immediately46 FRACLOW F32 0.0# Fraction of low pixels to reject immediately47 VARIANCES BOOL FALSE# Use image variances?48 COMBINE STR CLIPPED# Statistic to use for combination:53 PPMERGE_BIAS METADATA 54 REJ F32 3.0 # Rejection threshold (sigma) 55 ITER S32 2 # Number of rejection iterations 56 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 57 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 58 VARIANCES BOOL FALSE # Use image variances? 59 COMBINE STR CLIPPED # Statistic to use for combination: 49 60 END 50 61 … … 52 63 # Dark combination --- don't want min/max rejection 53 64 # More aggressive clipping than bias, so as to remove CRs 54 PPMERGE_DARK 55 REJ F32 3.0# Rejection threshold (sigma)56 ITER S32 2# Number of rejection iterations57 FRACHIGH F32 0.0# Fraction of high pixels to reject immediately58 FRACLOW F32 0.0# Fraction of low pixels to reject immediately59 VARIANCES BOOL TRUE# Use image variances?60 COMBINE STR CLIPPED# Statistic to use for combination:65 PPMERGE_DARK METADATA 66 REJ F32 3.0 # Rejection threshold (sigma) 67 ITER S32 2 # Number of rejection iterations 68 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 69 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 70 VARIANCES BOOL TRUE # Use image variances? 71 COMBINE STR CLIPPED # Statistic to use for combination: 61 72 END 62 73 63 74 # Flat combination --- use min/max rejection 64 PPMERGE_FLAT 65 REJ F32 3.0# Rejection threshold (sigma)66 ITER S32 1# Number of rejection iterations67 FRACHIGH F32 0.3# Fraction of high pixels to reject immediately68 FRACLOW F32 0.1# Fraction of low pixels to reject immediately69 NKEEP S32 5# Minimum number of pixels in stack to keep70 VARIANCES BOOL TRUE# Use image variances?71 COMBINE STR MEAN# Statistic to use for combination:75 PPMERGE_FLAT METADATA 76 REJ F32 3.0 # Rejection threshold (sigma) 77 ITER S32 1 # Number of rejection iterations 78 FRACHIGH F32 0.3 # Fraction of high pixels to reject immediately 79 FRACLOW F32 0.1 # Fraction of low pixels to reject immediately 80 NKEEP S32 5 # Minimum number of pixels in stack to keep 81 VARIANCES BOOL TRUE # Use image variances? 82 COMBINE STR MEAN # Statistic to use for combination: 72 83 END 73 84 74 85 75 86 # Fringe combination --- already included in default, above 76 PPMERGE_FRINGE 77 FRACHIGH F32 0.1# Fraction of high pixels to reject immediately78 VARIANCES BOOL TRUE# Use image variances?87 PPMERGE_FRINGE METADATA 88 FRACHIGH F32 0.1 # Fraction of high pixels to reject immediately 89 VARIANCES BOOL TRUE # Use image variances? 79 90 END 80 91 81 92 # Mask generation --- already included in default, above 82 93 PPMERGE_DARKMASK METADATA 83 ITER S32 2# Number of iterations84 MASK.BAD F32 0.2# Threshold for bad pixels (sigma)85 MASK.MODE STR FRACTION# Mode for identifying bad pixels in the suspect map86 MASK.SET.VALUE STR DARK# set this bit in the output mask94 ITER S32 2 # Number of iterations 95 MASK.BAD F32 0.2 # Threshold for bad pixels (sigma) 96 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 97 MASK.SET.VALUE STR DARK # set this bit in the output mask 87 98 END 88 99 89 100 # Mask generation --- already included in default, above 90 101 PPMERGE_FLATMASK METADATA 91 ITER S32 2# Number of iterations92 MASK.BAD F32 0.2# Threshold for bad pixels (sigma)93 MASK.MODE STR FRACTION# Mode for identifying bad pixels in the suspect map94 MASK.SET.VALUE STR FLAT# set this bit in the output mask102 ITER S32 2 # Number of iterations 103 MASK.BAD F32 0.2 # Threshold for bad pixels (sigma) 104 MASK.MODE STR FRACTION # Mode for identifying bad pixels in the suspect map 105 MASK.SET.VALUE STR FLAT # set this bit in the output mask 95 106 END 96 107 … … 98 109 # but it then sets a mask based on the resulting data values (using CTE.MIN) 99 110 PPMERGE_CTEMASK METADATA 100 REJ F32 3.0 # Rejection threshold (sigma) 101 ITER S32 2 # Number of rejection iterations 102 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 103 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 104 VARIANCES BOOL FALSE # Use image variances? 105 COMBINE STR CLIPPED # Statistic to use for combination: 106 CTE.MIN F32 0.2 # regions lower than this in the CTE image are masked 107 MASK.SET.VALUE STR CTE # set this bit in the output mask 111 REJ F32 3.0 # Rejection threshold (sigma) 112 ITER S32 2 # Number of rejection iterations 113 FRACHIGH F32 0.0 # Fraction of high pixels to reject immediately 114 FRACLOW F32 0.0 # Fraction of low pixels to reject immediately 115 VARIANCES BOOL FALSE # Use image variances? 116 COMBINE STR CLIPPED # Statistic to use for combination: 117 CTE.MIN F32 0.5 # regions lower than this in the CTE image are masked 118 MASK.SET.VALUE STR CTE # set this bit in the output mask 119 INPUT.MASKS.USE BOOL FALSE # respect the input mask data? 108 120 END 109 121 110 122 # Shutter generation --- already included in default, above 111 PPMERGE_SHUTTER 112 REJ F32 2.0# Rejection threshold (sigma)113 ITER S32 1# Number of rejection iterations123 PPMERGE_SHUTTER METADATA 124 REJ F32 2.0 # Rejection threshold (sigma) 125 ITER S32 1 # Number of rejection iterations 114 126 END
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